Probing Nanoscale Local Lattice Strains in Semiconductor Nanostructures and Devices by Transmission Electron Microscopy

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2018

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927618005354